![]() Despite its importance and ubiquity, the information contained in powder XRD data for nanoscale materials is not always fully harnessed, and in some cases, it is misinterpreted. As a bulk technique, the information it provides can be correlated with microscopy data to test if microscopic observations on a small number of particles are representative of the majority of the sample. Analysis of a sample by powder XRD provides important information that is complementary to various microscopic and spectroscopic methods, such as phase identification, sample purity, crystallite size, and, in some cases, morphology. Beyond the classroom, any researcher desiring structural information on materials would benefit from this book.Powder X-ray diffraction (XRD) is a common characterization technique for nanoscale materials. The sections are also ideal for more advanced coursework at the graduate level. The detailed structural treatments may be too much for the typical introductory x-ray diffraction course, but students would be adding a valuable text for future reference to their libraries. As a class text the book could be used in an introductory course for third or fourth year undergraduates in materials science, chemistry, physics, or geochemistry. The text is rich in references to internet resources, software, literature, organizations, databases, and institutions that x-ray researchers employ routinely. I find the book to be not only an excellent introduction to structural characterization, but also a valuable introduction to the world of the working crystallographer. The authors’ enthusiasm and dedication to the subject matter are clearly evident. The book is supplemented by online content, including color figures, powder diffraction data, examples, and web links. additional problems to help in assessment of students’ progress.an introduction to the mechanism of constraints, restraints and rigid bodies and a new example of structure solution of a pharmaceutical compound.expanded coverage of direct space structure solution techniques.addition of a difficult pseudo-symmetric indexing case.basics of quantitative analysis using the Rietveld method, including determination of amorphous content.brief introductions to the total scattering analysis and non-ambient powder diffractometry.expanded treatment of non-crystallographic symmetry.While developed as a text to teach students, the book is also a reference for academic and industrial researchers using the powder diffraction method in their daily work.The book requires no prior knowledge of the subject, but is comprehensive and detailed making it useful for both the novice and experienced user of the powder diffraction method.The book is divided into two parts: chapters one though fifteen give essential theoretical background, while chapters sixteen through twenty-five guide the reader through practical aspects of extracting structural information from powder data.įundamentals of Powder Diffraction and Structural Characterization of Materials, Second Edition is suited for undergraduate and graduate students and practitioners from materials science, solid-state chemistry, physics, geology, and literally any other science or engineering background, who demand structural information at the atomic resolution using the powder diffraction method. The emphasis is placed on powder diffraction data collected using conventional x-ray sources, which remain primary tools for thousands of researchers and students in their daily experimental work. This new edition provides an in-depth introduction to the theories and applications of the powder diffraction method for structure determination.
0 Comments
Leave a Reply. |
AuthorWrite something about yourself. No need to be fancy, just an overview. ArchivesCategories |